This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term “devices” includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices.
Product Details
Published:
02/28/1995
Number of Pages:
730
File Size:
1 file , 5.8 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus
