JEDEC JESD398 (R2009) PDF

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MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

Published by Publication Date Number of Pages
JEDEC 07/01/1972 14
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JEDEC JESD398 (R2009) – MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398

Product Details

Published:
07/01/1972
Number of Pages:
14
File Size:
1 file , 420 KB
Note:
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