JEDEC JESD398 (R2009) PDF

Description

JEDEC JESD398 (R2009) – MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398

Product Details

Published:

07/01/1972

Number of Pages:

14

File Size:

1 file , 420 KB

Note:

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