JEDEC JESD398 (R2009) – MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398
Product Details
Published:
07/01/1972
Number of Pages:
14
File Size:
1 file , 420 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
