SALE
JEDEC JESD 435 (R2009) PDF

JEDEC JESD 435 (R2009) PDF

Original price was: $62.00.Current price is: $37.00.

STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

Published by Publication Date Number of Pages
JEDEC 04/01/1976 23
PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

JEDEC JESD 435 (R2009) – STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

Product Details

Published:
04/01/1976
Number of Pages:
23
File Size:
1 file , 620 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

Related products