JEDEC JESD 353 (R2009) PDF

Description

JEDEC JESD 353 (R2009) – THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD

This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.

Product Details

Published:

04/01/1968

Number of Pages:

9

File Size:

1 file , 240 KB

Note:

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