“ISPE Good Practice Guide: Controlled Temperature Chambers Commissioning and Qualification Mapping and Monitoring PDF” has been added to your cart. View cart
SALE
JEDEC JEB 15 PDF
$141.00Original price was: $141.00.$85.00Current price is: $85.00.
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
JEDEC JEB 15 – TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.
Product Details
Published:
11/01/1969
Number of Pages:
97
File Size:
1 file
Note:
This product is unavailable in Russia, Ukraine, Belarus
