JEDEC EIA 323 (R2002) – AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.
Product Details
Published:
03/01/1966
Number of Pages:
9
File Size:
1 file , 300 KB
Note:
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