JEDEC EIA 323 (R2002) PDF

Description

JEDEC EIA 323 (R2002) – AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

Product Details

Published:

03/01/1966

Number of Pages:

9

File Size:

1 file , 300 KB

Note:

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