IEEE P1500 PDF

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IEEE Approved Draft Standard Testability Method for Embedded Core-based Integrated Circuits

Published by Publication Date Number of Pages
IEEE 09/14/2022 154
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IEEE P1500 – IEEE Approved Draft Standard Testability Method for Embedded Core-based Integrated Circuits

Revision Standard – Active – Draft.This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.

Product Details

Published:
09/14/2022
ISBN(s):
9781504486231
Number of Pages:
154
File Size:
1 file , 4.5 MB
Product Code(s):
STDAPE25356
Note:
This product is unavailable in Russia, Belarus