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IEEE P1500 PDF
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IEEE Approved Draft Standard Testability Method for Embedded Core-based Integrated Circuits
Published by | Publication Date | Number of Pages |
IEEE | 09/14/2022 | 154 |
IEEE P1500 – IEEE Approved Draft Standard Testability Method for Embedded Core-based Integrated Circuits
Revision Standard – Active – Draft.This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.
Product Details
- Published:
- 09/14/2022
- ISBN(s):
- 9781504486231
- Number of Pages:
- 154
- File Size:
- 1 file , 4.5 MB
- Product Code(s):
- STDAPE25356
- Note:
- This product is unavailable in Russia, Belarus