IEEE 759 PDF

Description

IEEE 759 – IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

New IEEE Standard – Inactive-Withdrawn.Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.

Product Details

Published:

12/15/1984

ISBN(s):

0738107158, 9780738107158

Number of Pages:

0

File Size:

1 file , 520 KB

Product Code(s):

STDWD09803

Note:

This product is unavailable in Russia, Belarus