IEEE 2870 PDF
$34.00
IEEE Guide for Grip Test Method for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-Effect
Published by | Publication Date | Number of Pages |
IEEE | n/a | 25 |
Description
IEEE 2870 – IEEE Guide for Grip Test Method for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-Effect
New IEEE Standard – Active. Introduced in this guide is the grip test method for fittings of high-temperature, low-sag overhead conductor with long-term operating temperature of between 90 °C and 250 °C in the coeffect of the tension and the current.
Product Details
- Number of Pages:
- 25
- File Size:
- 1 file , 3.3 MB
- Product Code(s):
- STD25256, STDPD25256
- Note:
- This product is unavailable in Russia, Ukraine, Belarus