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IEEE 218 PDF
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IEEE Standard Methods of Testing Transistors
| Published by | Publication Date | Number of Pages |
| IEEE | 11/30/1955 | 6 |
IEEE 218 – IEEE Standard Methods of Testing Transistors
New IEEE Standard – Inactive-Withdrawn.
Product Details
- Published:
- 11/30/1955
- ISBN(s):
- 9781504402095
- Number of Pages:
- 6
- File Size:
- 1 file , 3.5 MB
- Product Code(s):
- STDWD02568
- Note:
- This product is unavailable in Russia, Belarus
