IEEE 1687 – IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
New IEEE Standard – Active.A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.
Product Details
Published:
12/05/2014
ISBN(s):
9780738194165, 9780738194172, 9781504416832
Number of Pages:
266
File Size:
1 file , 8 MB
Product Code(s):
STD20033, STDPD20033, STDPL20033
Note:
This product is unavailable in Russia, Ukraine, Belarus
