IEEE 1620 PDF

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IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

Published by Publication Date Number of Pages
IEEE 12/05/2008 26
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IEEE 1620 – IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

Revision Standard – Inactive-Reserved.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.

Product Details

Published:
12/05/2008
ISBN(s):
9780738160139, 9780738169514, 9781504469333
Number of Pages:
26
File Size:
1 file , 750 KB
Redline File Size:
2 files , 1.9 MB
Product Code(s):
STDRES95827, STDSURL95827
Note:
This product is unavailable in Russia, Belarus