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IEEE 1620 PDF
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IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Published by | Publication Date | Number of Pages |
IEEE | 12/05/2008 | 26 |
IEEE 1620 – IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Revision Standard – Inactive-Reserved.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.
Product Details
- Published:
- 12/05/2008
- ISBN(s):
- 9780738160139, 9780738169514, 9781504469333
- Number of Pages:
- 26
- File Size:
- 1 file , 750 KB
- Redline File Size:
- 2 files , 1.9 MB
- Product Code(s):
- STDRES95827, STDSURL95827
- Note:
- This product is unavailable in Russia, Belarus