IEEE 1500 PDF

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IEEE Standard Testability Method for Embedded Core-based Integrated Circuits

Published by Publication Date Number of Pages
IEEE 08/29/2005 117
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IEEE 1500 – IEEE Standard Testability Method for Embedded Core-based Integrated Circuits

New IEEE Standard – Inactive-Reserved.This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.

Product Details

Published:
08/29/2005
ISBN(s):
0738146935, 9780738146942
Number of Pages:
117
File Size:
1 file , 1.1 MB
Product Code(s):
STDRES95335
Note:
This product is unavailable in Russia, Belarus