New IEEE Standard – Superseded.The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.
Product Details
Published:
03/20/2000
ISBN(s):
0738117552, 9780738117560, 9780738117553
Number of Pages:
84
File Size:
1 file , 2.5 MB
Product Code(s):
STD94761, STDSU94761, STDPD94761
Note:
This product is unavailable in Russia, Ukraine, Belarus
