IEC 63287-1 Ed. 1.0 b PDF

Description

IEC 63287-1 Ed. 1.0 b – Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification

This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.

NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.

NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.

Product Details

Edition:

1.0

Published:

08/01/2021

ISBN(s):

9782832210172

Number of Pages:

90

File Size:

1 file , 2.7 MB

Note:

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