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Semiconductor devices – Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Part 1: Test method for bias temperature instability
IEC 63275-1 Ed. 1.0 b – Semiconductor devices – Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Part 1: Test method for bias temperature instability
This part of IEC 63275 gives a test method to evaluate gate threshold voltage shift of silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (MOSFETs) using room temperature readout after applying continuous positive gate-source voltage stress at elevated temperature. The proposed method accepts a certain amount of recovery by allowing large delay times between stress and measurement (up to 10 h).
Product Details
Edition:
1.0
Published:
04/01/2022
ISBN(s):
9782832211015
Number of Pages:
30
File Size:
1 file , 1.1 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus
