IEC 62951-6 Ed. 1.0 b – Semiconductor devices – Flexible and stretchable semiconductor devices – Part 6: Test method for sheet resistance of flexible conducting films
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
Product Details
Edition:
1.0
Published:
05/06/2019
Number of Pages:
50
File Size:
1 file , 1.9 MB
Note:
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