IEC 62415 Ed. 1.0 b PDF

IEC 62415 Ed. 1.0 b PDF

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Semiconductor devices – Constant current electromigration test

Published by Publication Date Number of Pages
IEC 05/19/2010 22
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Description

IEC 62415 Ed. 1.0 b – Semiconductor devices – Constant current electromigration test

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Product Details

Edition:
1.0
Published:
05/19/2010
Number of Pages:
22
File Size:
1 file , 910 KB
Note:
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