IEC 62047-7 Ed. 1.0 b PDF

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Semiconductor devices – Micro-electromechanical devices – Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

Published by Publication Date Number of Pages
IEC 06/16/2011 56
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IEC 62047-7 Ed. 1.0 b – Semiconductor devices – Micro-electromechanical devices – Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.

Product Details

Edition:
1.0
Published:
06/16/2011
Number of Pages:
56
File Size:
1 file , 830 KB
Note:
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