Description
IEC 60759 Ed. 1.0 b – Standard test procedures for semiconductor X-ray energy spectrometers
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
Product Details
- Edition:
- 1.0
- Published:
- 01/01/1983
- Number of Pages:
- 97
- File Size:
- 1 file , 4.5 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus