IEC 60749-8 Ed. 1.0 b PDF

Description

IEC 60749-8 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 8: Sealing

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

Product Details

Edition:

1.0

Published:

08/30/2002

Number of Pages:

31

File Size:

1 file , 560 KB

Note:

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