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Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement and the analysis of other residual gases standard by International Electrotechnical Commission, 04/09/2002
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
Product Details
Edition:
1.0
Published:
04/09/2002
Number of Pages:
15
File Size:
1 file , 430 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
