IEC 60749-6 Ed. 1.0 b:2002 PDF

IEC 60749-6 Ed. 1.0 b:2002 PDF

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Semiconductor devices – Mechanical and climatic test methods – Part 6: Storage at high temperature
standard by International Electrotechnical Commission, 04/12/2002

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Description

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

Product Details

Edition:
1.0
Published:
04/12/2002
Number of Pages:
7
File Size:
1 file , 380 KB
Note:
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