IEC 60749-43 Ed. 1.0 b PDF

Description

IEC 60749-43 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Product Details

Edition:

1.0

Published:

06/15/2017

Number of Pages:

74

File Size:

1 file , 1.1 MB

Note:

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