IEC 60749-43 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Product Details
Edition:
1.0
Published:
06/15/2017
Number of Pages:
74
File Size:
1 file , 1.1 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus
