IEC 60749-4 Ed. 2.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition:
a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
c) allowance of additional time-to-test delay or return-to-stress delay.
Product Details
- Edition:
- 2.0
- Published:
- 03/03/2017
- Number of Pages:
- 20
- File Size:
- 1 file , 1.1 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
