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Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST) standard by International Electrotechnical Commission, 04/12/2002
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
Product Details
Edition:
1.0
Published:
04/12/2002
Number of Pages:
15
File Size:
1 file , 510 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
