IEC 60749-31 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
Product Details
Edition:
1.0
Published:
08/30/2002
Number of Pages:
9
File Size:
1 file , 330 KB
Note:
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