IEC 60749-12 Ed. 2.0 b PDF

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Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency

Published by Publication Date Number of Pages
IEC 12/13/2017 14
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IEC 60749-12 Ed. 2.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision.A This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Product Details

Edition:
2.0
Published:
12/13/2017
Number of Pages:
14
File Size:
1 file , 240 KB
Note:
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