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Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency standard by International Electrotechnical Commission, 04/30/2002
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
Product Details
Edition:
1.0
Published:
04/30/2002
Number of Pages:
7
File Size:
1 file , 380 KB
Note:
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