IEC 60333 Ed. 3.0 b – Nuclear instrumentation – Semiconductor charged-particle detectors – Test procedures
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
Product Details
Edition:
3.0
Published:
07/14/1993
Number of Pages:
76
File Size:
1 file , 3.7 MB
Note:
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