ESD TR5.4-02 PDF

ESD TR5.4-02 PDF

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Determination of CMOS Latch-up Susceptibility, Transient Induced Latch-Up – Technical Report No. 2

Published by Publication Date Number of Pages
ESD 2008 62
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Description

ESD TR5.4-02 – Determination of CMOS Latch-up Susceptibility, Transient Induced Latch-Up – Technical Report No. 2

This technical report is intended to provide background information pertaining to the development of the transient latch-up standard practice.

Product Details

Published:
2008
Number of Pages:
62
File Size:
1 file , 1.3 MB
Note:
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