BS DD ENV 50219 PDF

BS DD ENV 50219 – Description of the reliability test structures of the European mini test chip

Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).

Cross References:
CENELEC Document Ref. No. R 117-001
PD 6595
CENELEC R 117-001
CENELEC R 117-005
CENELEC R 117-006
CENELEC R 117- ‘Description of a Parametrized European Mini Test Chip’
CENELEC R 117- ‘Data Interchange Format for Simulated and Measured Data (ISMD)’
CENELEC ‘R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip’
CENELEC R 117- ‘Evaluation of the Reliability Test Structures of the European Mini Test Chip’

Product Details

Published:

09/15/1996

ISBN(s):

0580260372

Number of Pages:

42

File Size:

1 file , 980 KB

Product Code(s):

00835677, 00835677, 00835677

Note:

This product is unavailable in Ukraine, Russia, Belarus