BS CECC 00013 – Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.
Product Details
Published:
08/30/1985
ISBN(s):
0580146022
Number of Pages:
28
File Size:
1 file , 820 KB
Product Code(s):
00140153, 00140153, 00140153
Note:
This product is unavailable in Ukraine, Russia, Belarus
