ASTM F1262M – Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (matl.)/s.
1.1.1Discussion-This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.
Product Details
Published:
06/01/2014
Number of Pages:
6
File Size:
1 file , 89 KB
Redline File Size:
2 files , 170 KB
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