Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

Published by	Publication Date	Number of Pages
ASTM	05/01/2016	7

Category: ASTM

Description

ASTM F744M – Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).