ASTM F996-98(2003) PDF

Description

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

Product Details

Published:

01/01/2003

Number of Pages:

7

File Size:

1 file , 89 KB

Note:

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