Home JIS JIS C 2162 PDF SALE JIS C 2162 PDF$49.00 Original price was: $49.00.$29.00Current price is: $29.00. Test method of long-term reliability of gate insulator for SiC devices at high temperaturestandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010 JIS C 2162 PDF quantity Add to cart PDF FormatMulti-User AccessPrintableOnline Download Category: JIS Description JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus Related products AS 2198 PDF $40.00 Original price was: $40.00.$20.00Current price is: $20.00. Add to cart ASME Y14.24 PDF $130.00 Original price was: $130.00.$78.00Current price is: $78.00. Add to cart AWS D10.18M/D10.18 PDF $79.00 Original price was: $79.00.$47.00Current price is: $47.00. Add to cart IPC JEDEC-9704A PDF $168.00 Original price was: $168.00.$101.00Current price is: $101.00. Add to cart
JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus
