JEDEC JESD 22-B108A PDF
$32.00
COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2003
Description
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.
Product Details
- Published:
- 01/01/2003
- Number of Pages:
- 11
- File Size:
- 1 file , 69 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus