JEDEC JESD28-1 PDF

$32.00

N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS

Published by Publication Date Number of Pages
JEDEC 09/01/2001 14
PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

Description

JEDEC JESD28-1 – N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

Product Details

Published:
09/01/2001
Number of Pages:
14
File Size:
1 file , 55 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus