JEDEC JESD51-4 PDF
$34.00
THERMAL TEST CHIP GUIDELINE (WIRE BOND TYPE CHIP)
standard by JEDEC Solid State Technology Association, 02/01/1997
Description
This guideline describes design requirements for wire bond type semiconductor chips to be used for thermal resistance listing of IC packages. This document provides specific guidelines for chip design but allows flexibility in the materials and layout requirements.
Product Details
- Published:
- 02/01/1997
- Number of Pages:
- 15
- File Size:
- 1 file , 310 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus