JEDEC JESD659C PDF

Description

JEDEC JESD659C – FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

This method establishes requirements for application of Statistical Reliability Monitoring ‘SRM’ technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625 after revision, September 1999.

Product Details

Published:

04/01/2017

Number of Pages:

16

File Size:

1 file , 170 KB

Note:

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