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IEEE 1500 PDF
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IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
Published by | Publication Date | Number of Pages |
IEEE | 08/29/2005 | 117 |
IEEE 1500 – IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
New IEEE Standard – Inactive-Reserved.This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.
Product Details
- Published:
- 08/29/2005
- ISBN(s):
- 0738146935, 9780738146942
- Number of Pages:
- 117
- File Size:
- 1 file , 1.1 MB
- Product Code(s):
- STDRES95335
- Note:
- This product is unavailable in Russia, Belarus