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IEEE 1620-2004 PDF
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Standard for Test Methods for the Characterization of Organic Transistors and Materials
standard by IEEE, 04/29/2004
New IEEE Standard – Superseded.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Product Details
- Published:
- 04/29/2004
- ISBN(s):
- 0738139920, 9780738139937
- Number of Pages:
- 20
- File Size:
- 1 file , 140 KB
- Product Code(s):
- STDSU95219
- Note:
- This product is unavailable in Russia, Belarus