Discrete semiconductor devices and integrated circuits – Part 5-3: Optoelectronic devices – Measuring methods CONSOLIDATED EDITION

Published by	Publication Date	Number of Pages
IEC	11/25/2009	86

Category: IEC

Description

IEC 60747-5-3 Ed. 1.1 b – Discrete semiconductor devices and integrated circuits – Part 5-3: Optoelectronic devices – Measuring methods CONSOLIDATED EDITION

IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (2002). Therefore, no need to order amendment in addition to this publication.

This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.