IEC 60749-4 Ed. 1.0 b:2002 PDF

IEC 60749-4 Ed. 1.0 b:2002 PDF

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Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
standard by International Electrotechnical Commission, 04/12/2002

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Description

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Product Details

Edition:
1.0
Published:
04/12/2002
Number of Pages:
15
File Size:
1 file , 510 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus

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