Semiconductor devices – Micro-electromechanical devices – Part 2: Tensile testing method of thin film materials

Published by	Publication Date	Number of Pages
IEC	08/15/2006	25

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Category: IEC

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IEC 62047-2 Ed. 1.0 b – Semiconductor devices – Micro-electromechanical devices – Part 2: Tensile testing method of thin film materials

Specifies the method for tensile testing of thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for micro-electromechanical systems (MEMS), micromachines and similar devices. The main structural materials for MEMS, micromachines and similar devices have special features such as typical dimensions in the order of a few microns, a material fabrication by deposition, and a test piece fabrication by non-mechanical machining using etching and photolithography. This International Standard specifies the testing method, which enables a guarantee of accuracy corresponding to the special features.