IEC 62951-5 Ed. 1.0 b PDF

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Semiconductor devices – Flexible and stretchable semiconductor devices – Part 5: Test method for thermal characteristics of flexible materials

Published by Publication Date Number of Pages
IEC 02/27/2019 33
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IEC 62951-5 Ed. 1.0 b – Semiconductor devices – Flexible and stretchable semiconductor devices – Part 5: Test method for thermal characteristics of flexible materials

IEC 62951-5:2019 specifies the test method for thermal characteristics of flexible materials. This document includes terms, definitions, symbols, and test methods that can be used to evaluate and determine thermal characteristics of flexible materials for practical use. The measurement method relies on non-contact optical thermometry that is based on temperature dependent optical reflectance. This document is applicable to both substrate and thin-film flexible semiconductor materials that are subjected to bending and stretching.

Product Details

Edition:
1.0
Published:
02/27/2019
Number of Pages:
33
File Size:
1 file , 2.1 MB
Note:
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