IEC 63003 Ed. 1.0 en PDF

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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505¿¿¿

Published by Publication Date Number of Pages
IEC 12/14/2015 162
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IEC 63003 Ed. 1.0 en – Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505¿¿¿

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

Product Details

Edition:
1.0
Published:
12/14/2015
Number of Pages:
162
File Size:
1 file , 2.7 MB
Note:
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