BS DD ENV 50219 PDF
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Description of the reliability test structures of the European mini test chip
| Published by | Publication Date | Number of Pages |
| BSI | 09/15/1996 | 42 |
BS DD ENV 50219 – Description of the reliability test structures of the European mini test chip
Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).
Cross References:
CENELEC Document Ref. No. R 117-001
PD 6595
CENELEC R 117-001
CENELEC R 117-005
CENELEC R 117-006
CENELEC R 117- ‘Description of a Parametrized European Mini Test Chip’
CENELEC R 117- ‘Data Interchange Format for Simulated and Measured Data (ISMD)’
CENELEC ‘R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip’
CENELEC R 117- ‘Evaluation of the Reliability Test Structures of the European Mini Test Chip’
Product Details
- Published:
- 09/15/1996
- ISBN(s):
- 0580260372
- Number of Pages:
- 42
- File Size:
- 1 file , 980 KB
- Product Code(s):
- 00835677, 00835677, 00835677
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
